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Title: Mobility-lifetime products in hydrogenated amorphous silicon

The most important parameters characterizing the photoelectronic quality of a semiconductor are its charge-carrier mobility lifetime, {mu}{tau}, products. The two common experimental methods used to determine these parameters in hydrogenated amorphous silicon, {ital a}-Si:H, are the steady-state photoconductivity measurement and the life-of-flight charge-collection measurement. The two methods yield quite different results. We show that the difference can be resolved by an understanding of the physics involved in each of the measurements. We show that the steady-state {mu}{tau} is expected to be up to three orders of magnitude larger than the time-of-flight {mu}{tau} in undoped {ital a}-Si:H. This prediction is in excellent agreement with the corresponding experimental results.
Authors:
 [1] ;  [2]
  1. (Solar Energy Research Institute, Golden, Colorado 80401 (US))
  2. (The Racah Institute of Physics, The Hebrew University, Jerusalem (Israel))
Publication Date:
OSTI Identifier:
6012395
DOE Contract Number:
AC02-83CH10093
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; (USA); Journal Volume: 58:5
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; SILANES; CARRIER LIFETIME; CARRIER MOBILITY; HYDROGENATION; PHOTOCONDUCTIVITY; CHEMICAL REACTIONS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; HYDRIDES; HYDROGEN COMPOUNDS; LIFETIME; MOBILITY; ORGANIC COMPOUNDS; ORGANIC SILICON COMPOUNDS; PHYSICAL PROPERTIES; SILICON COMPOUNDS 360603* -- Materials-- Properties