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Title: Evaluation of HgI[sub 2] detectors for lead detection in paint

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:5970812
; ;  [1]
  1. Xsirius, Inc., Marina del Rey, CA (United States)

The authors conducted a laboratory study of HgI[sub 2] spectrometers used for in-situ determination of lead on painted surfaces. [sup 109]Cd and [sup 57]Co isotopes have been used to excite lead characteristic x-rays from samples. The energy resolution of HgI[sub 2] detectors in the energy region corresponding to lead K x-rays has been measured. An energy resolution of 880 eV (FWHM) for the 60 keV line from an [sup 241]Am source has been obtained. Measurements using thin film standards ranging from 0.5 mg Pb/cm[sup 2] to 2 mg Pb/cm[sup 2] have been conducted. Detection limits, accuracy and precision of the measurements have been estimated. Based upon a comparison of the results that the authors have obtained with the performance of existing detector technology, the HgI[sub 2] detectors seem to be the best solution for handheld XRF lead analyzers.

OSTI ID:
5970812
Report Number(s):
CONF-921005-; CODEN: IETNAE
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 40:4 part 1; Conference: Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference, Orlando, FL (United States), 25-31 Oct 1992; ISSN 0018-9499
Country of Publication:
United States
Language:
English