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Title: Visual-microscopic studies of submicron domain structures in iron-garnet epitaxial films

Journal Article · · Sov. Microelectron.; (United States)
OSTI ID:5893955

It has been pointed out in recent literature that visual-microscopic methods are not suitable for studying the parameters of iron-garnet epitaxial structures (IGES) of submicron thicknesses. The authors show that visual-microscopic methods are suitable for studying the parameters of bismuth-free IGES with a domain size of up to 0.1 submicrons and epitaxial-layer thickness of less than 0.1 submicrons, on condition that the parameters of the measuring setup are optimized. The authors consider the optimization of the conditions for observing a domain structure with allowance for the real characteristics of the polarizers. Optimum conditions for observing a domain structure are attained when the axis of the analyzer is rotated through several degrees relative to the position of crossing with the polarizer; the exact angle of rotation is determined by both the quality of the polarizers and the magnitude of the Faraday rotation of the sample studied. Measurements of the period, collapse field, elliptical instability field, and uniaxial anisotropy field of an epitaxial structure with submicron bubble domains were made with the aid of a laser microscope.

Research Organization:
Institute of Electronic Engineering, Moscow, USSR
OSTI ID:
5893955
Journal Information:
Sov. Microelectron.; (United States), Vol. 15:4; Other Information: Translated from Mikroelektronika Akad. Nauk SSSR; 15: No. 4, 338-343(Jul-Aug 1986)
Country of Publication:
United States
Language:
English