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Title: Double-crystal monochromator for a PF 60-period soft x-ray undulator (abstract)

Since undulator light is sharply collimated itself, it can be effectively monochromatized by a perfect crystal. An x-ray double-crystal monochromator with a fixed exit has been designed and built for the use of undulator light from a 60-period undulator at Photon Factory (beamline 2A). Available Bragg angle ranges from 7/degree/ to 80/degree/. Angle scan is made by means of a goniometer outside the vacuum chamber, with the finest step of 0.1 arcsec. Magnetic fluid is used as the vacuum seal of the feedthrough. The fixed exit beam position is kept by translating the second crystal along the two mechanical guides: one for normal and the other for parallel to the crystal surface. Adjustment of the parallelity of two crystals is made manually with flexible wires. Since a total power in the central coherent portion which is limited by a 1/times/1-mm/sup 2/ slit is not so much, a stable operation is possible without cooling the crystal. Currently, InSb (111) reflection is used. The diffracting planes of the first cyrstal is 1/degree/ off from the surface and the second is the symmetric reflection. At its fifth harmonics, brilliant undulator light of approximately 10/sup 12/ photons/s mm/sup 2/ with 1-eV energy resolution ismore » available (/ital E/=2 keV).« less
Authors:
; ; ;
Publication Date:
OSTI Identifier:
5830010
Resource Type:
Journal Article
Resource Relation:
Journal Name: Rev. Sci. Instrum.; (United States); Journal Volume: 60:7
Research Org:
Photon Factory, National Laboratory for High Energy Physics, Japan (US)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; MONOCHROMATORS; ENERGY RESOLUTION; SOFT X RADIATION; DIFFRACTION; BICRYSTALS; BRAGG REFLECTION; GONIOMETERS; HARMONICS; KEV RANGE 01-10; RADIATION FLUX; COHERENT SCATTERING; CRYSTALS; ELECTROMAGNETIC RADIATION; ENERGY RANGE; IONIZING RADIATIONS; KEV RANGE; MEASURING INSTRUMENTS; OSCILLATIONS; POLYCRYSTALS; RADIATIONS; REFLECTION; RESOLUTION; SCATTERING; X RADIATION 440300* -- Miscellaneous Instruments-- (-1989)