Atomic and electronic structure of Fe films grown on Pd l brace 001 r brace
- College of Engineering and Applied Science, State University of New York, Stony Brook, New York 11794 (US)
- IBM Research Center, P.O. Box 218, Yorktown Heights, New York 10598 (USA)
The atomic and electronic structure of Fe films grown on Pd{l brace}001{r brace} is investigated by means of low-energy electron diffraction and angle-resolved photoemission spectroscopy (ARPES). The films grow pseudomorphically, probably by way of nucleation and growth of flat islands, which ultimately coalesce to form continuous Fe{l brace}001{r brace} films. The structure of these continuous films, if grown at slow rates (of the order of 0.1 A/min), is body-centered tetragonal and is shown to be a distortion from the stable bcc structure of Fe: the in-plane lattice constant is 2.75 A, as dictated by the Pd{l brace}001{r brace} substrate, and the bulk interlayer spacing is 1.50--1.53 A. In 10--12-layer films the first interlayer spacing is expanded by 3.6% above bulk, but with increasing thickness that spacing contracts progressively to about 6.3% below the bulk value in 40--50-layer films. Films as thick as 60--70 layers can be grown pseudomorphically at slow rates despite the large misfit (4.2%) between bcc Fe{l brace}001{r brace} and fcc Pd{l brace}001{r brace}. ARPES data indicate that these films are electronically indistinguishable from bulk bcc Fe. Thick (about 200-layer) films grown at fast rates are essentially bcc, with in-plane lattice constants of 2.87 A, but with slightly expanded (3%) interlayer spacing, attributed to the presence of carbon impurities.
- DOE Contract Number:
- FG02-86ER45239
- OSTI ID:
- 5736539
- Journal Information:
- Physical Review, B: Condensed Matter; (USA), Vol. 43:5; ISSN 0163-1829
- Country of Publication:
- United States
- Language:
- English
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360104* - Metals & Alloys- Physical Properties