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Title: Los Alamos x-ray characterization facilities for plasma diagnostics

A summary is given of characteristics of x-ray sources used by Los Alamos National Laboratory to calibrate various x-ray diagnostic packages and components. Included are D.C. sourcs in electron impact and fluorescence modes, a pulsed laser source for soft x rays with 100 ps time resolution, Febetron pulsed electron impact sources, and both EUV and x-ray synchrotron beamlines.
Authors:
; ; ; ;
Publication Date:
OSTI Identifier:
5628529
Report Number(s):
LA-UR-86-2254; CONF-860880-4
ON: DE86012427
DOE Contract Number:
W-7405-ENG-36
Resource Type:
Conference
Resource Relation:
Conference: 30. SPIE technical symposium on optics and optoelectronic engineering, San Diego, CA, USA, 17 Aug 1986; Other Information: Portions of this document are illegible in microfiche products
Research Org:
Los Alamos National Lab., NM (USA)
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; LASER RADIATION; PLASMA DIAGNOSTICS; LASER TARGETS; PLASMA DENSITY; PLASMA INSTABILITY; X RADIATION; X-RAY SPECTROSCOPY; ELECTROMAGNETIC RADIATION; INSTABILITY; IONIZING RADIATIONS; RADIATIONS; SPECTROSCOPY; TARGETS 420300* -- Engineering-- Lasers-- (-1989)