Shock characterization of toad pins
- Explosive Projects and Diagnostics Department, 2554, Sandia National Laboratories 87185 (United States)
- Ktech Corp., 901 Pennsylvania NE, Albuquerque, New Mexico 87110 (United States)
The purpose of this program was to characterize Time Of Arrival Detectors (TOAD) pins response to shock loading with respect to risetime, amplitude, repeatability and consistency. TOAD pins were subjected to impacts of 35 to 420 kilobars amplitude and approximately 1 ms pulse width to investigate the timing spread of four pins and the voltage output profile of the individual pins. Sets of pins were also aged at 45{degree}, 60{degree} and 80{degree}C for approximately nine weeks before shock testing at 315 kilobars impact stress. Four sets of pins were heated to 50.2{degree}C (125{degree}F) for approximately two hours and then impacted at either 50 or 315 kilobars. Also, four sets of pins were aged at 60{degree}C for nine weeks and then heated to 50.2{degree}C before shock testing at 50 and 315 kilobars impact stress, respectively. Particle velocity measurements at the contact point between the stainless steel targets and TOAD pins were made using a Velocity Interferometer System for Any Reflector (VISAR) to monitor both the amplitude and profile of the shock waves. {copyright} {ital 1996 American Institute of Physics.}
- OSTI ID:
- 561840
- Report Number(s):
- CONF-950846-; ISSN 0094-243X; TRN: 9716M0110
- Journal Information:
- AIP Conference Proceedings, Vol. 370, Issue 1; Conference: American Physical Society biennial conference on shock compression of condensed matter, Seattle, WA (United States), 13-18 Aug 1995; Other Information: PBD: May 1996
- Country of Publication:
- United States
- Language:
- English
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