Some computational aspects of the hals (harmonic analysis of x-ray line shape) method

Journal Article · Sat Feb 01 00:00:00 EST 1986 · Ind. Lab. (Engl. Transl.); (United States)

OSTI ID:5499228

Moshkina, T I; Nakhmanson, M S

This paper discusses the problem of distinguishing the analytical line from the background and approximates the background component. One of the constituent parts of the program package in the procedural-mathematical software for x-ray investigations of polycrystalline substances in application to the DRON-3, DRON-2 and ADP-1 diffractometers is the SSF system of programs, which is designed for determining the parameters of the substructure of materials. The SSF system is tailored not only to Unified Series (ES) computers, but also to the M-6000 and SM-1 minicomputers.

• Research Organization: Burevestnik Sci-Res Union, Leningrad
• OSTI ID: 5499228
• Journal Information: Ind. Lab. (Engl. Transl.); (United States), Vol. 51:8
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
POLYCRYSTALS
X-RAY DIFFRACTION
X-RAY DIFFRACTOMETERS
ON-LINE SYSTEMS
PROGRAMMING
CRYSTAL STRUCTURE
ES COMPUTERS
FOURIER TRANSFORMATION
GERMANIUM
HARMONICS
IMAGE PROCESSING
SEMICONDUCTOR MATERIALS
SPATIAL RESOLUTION
STRUCTURAL CHEMICAL ANALYSIS
COHERENT SCATTERING
COMPUTERS
CRYSTALS
DIFFRACTION
DIFFRACTOMETERS
ELEMENTS
INTEGRAL TRANSFORMATIONS
MATERIALS
MEASURING INSTRUMENTS
METALS
OSCILLATIONS
PROCESSING
RESOLUTION
SCATTERING
TRANSFORMATIONS
360602* - Other Materials- Structure & Phase Studies