Properties of interface-engineered high T{sub c} Josephson junctions
- Conductus, Inc., 969 W. Maude Avenue, Sunnyvale, California 94086 (United States)
We have created YBCO thin film ramp edge Josephson junctions by modification of the edge surface prior to counterelectrode deposition. No deposited interlayer or barrier layer is employed. These devices are uniform and reproducible, and they display resistively shunted junction current-voltage characteristics with excellent magnetic field modulation. I{sub c}R{sub n} values over the range 0.5{endash}3 mV and corresponding R{sub n}A values of 6{times}10{sup {minus}8}{endash}1.2{times}10{sup {minus}9}{Omega}cm{sup 2} at 20 K are easily attained by varying the process. We believe these junctions offer significant promise as the building blocks of a high T{sub c} electronics technology. {copyright} {ital 1997 American Institute of Physics.}
- OSTI ID:
- 543756
- Journal Information:
- Applied Physics Letters, Vol. 71, Issue 17; Other Information: PBD: Oct 1997
- Country of Publication:
- United States
- Language:
- English
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