Attachment to spextrophotometers for measuring scattering patterns

Journal Article · Sat Feb 01 00:00:00 EST 1986 · J. Appl. Spectrosc. (Engl. Transl.); (United States)

OSTI ID:5395340

Fsel'son, M P; Krikum, A Z; Sivyakov, Y A; Spivak, R Y

The authors have developed a simple attachment to the Shimadsu MPS 50L spectrophotometer for measuring scattering patterns. The attachment is mounted directly at the cuvette section of the spectrophotometer. The radiation detector of the attachment is formed by an FR1-4 photoresistor disposed on the vertical section of a gamma-shaped bar adapted to be inclined by plus or minus 90 degrees with respect to the direction of the radiation beam. When the attachment is used, its radiation detector is connected into the measuring circuit of the spectrophotometer in place of the spectrophotometer's detector. When the spectrophotometer alone is used the detector of the attachment is moved out of the beam and the detector of the spectrophotometer proper is inserted into the measuring circuit.

• OSTI ID: 5395340
• Journal Information: J. Appl. Spectrosc. (Engl. Transl.); (United States), Vol. 43:2
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
SPECTROPHOTOMETERS
DESIGN
PHOTODETECTORS
BEAM OPTICS
EFFICIENCY
OPERATION
RELAYS
SCATTERING
SWITCHES
ELECTRICAL EQUIPMENT
EQUIPMENT
MEASURING INSTRUMENTS
440300* - Miscellaneous Instruments- (-1989)