Growth and characterization of CdTe, Mn(x)Cd(1-x)Te, Zn(x)Cd(1-x)Te, and CdSe(y)Te(1-y) crystals

Journal Article · Thu May 01 00:00:00 EDT 1986 · J. Electrochem. Soc.; (United States)

DOI:https://doi.org/10.1149/1.2108703· OSTI ID:5243941

Lay, K Y; Giles-Taylor, N C; Schetzina, J F; Bachmann, K J

Structures and growth characteristics of crystals based on the Cd-Te lattice, which are potentially useful in infrared radiation detectors, are described. Single crystals of CdTe, Mn(x)Cd(1-x)Te, and CdSe(y)Te(1-y) have been grown by the vertical Bridgman method and those of Zn(x)Cd(1-l)Te by zone leveling. Photoluminescence (PL) spectra were used to determine the quality and uniformity of composition. From the probing of small areas, allowed by this PL characterization technique, the uniform incorporation of Mn, Zn, and Se into the CdTe lattice was determined. 15 references.

• Research Organization: North Carolina State Univ., Raleigh
• OSTI ID: 5243941
• Journal Information: J. Electrochem. Soc.; (United States), Vol. 133
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CADMIUM TELLURIDES
CRYSTAL GROWTH
BRIDGMAN METHOD
MANGANESE COMPOUNDS
MICROHARDNESS
MONOCRYSTALS
PHOTOLUMINESCENCE
SELENIUM COMPOUNDS
TWINNING
ZINC COMPOUNDS
CADMIUM COMPOUNDS
CHALCOGENIDES
CRYSTAL GROWTH METHODS
CRYSTALS
HARDNESS
LUMINESCENCE
MECHANICAL PROPERTIES
TELLURIDES
TELLURIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
360602* - Other Materials- Structure & Phase Studies