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Title: Proton-induced radiation damage in germanium detectors

High-purity germanium (HPGe) detectors will be used in future space missions for gamma-ray measurements and will be subject to interactions with energetic particles. To simulate this process several large-volume n-type HPGe detectors were incrementally exposed to a particle fluence of up to 10{sub 8} protons cm{sup {minus}2} (proton energy: 1.5 GeV) at different operating temperatures (90 to 120 K) to induce radiation damage. Basic scientific as well as engineering data on detector performance were collected. During the incremental irradiation, the peak shape produced by the detectors showed a significant change from a Gaussian shape to a broad complex structure. After the irradiation all detectors were thoroughly characterized by measuring many parameters. To remove the accumulated radiation damage the detectors were stepwise annealed at temperatures T {le} 110{degrees}C while staying specially designed cryostats. This paper shows that n-type HPGe detectors can be used in charged particles environments as high-energy resolution devices until a certain level of radiation damage is accumulated and that the damage can be removed at moderate annealing temperatures and the detector returned to operating condition.
Authors:
; ;  [1] ;  [2] ; ;  [3] ;  [4] ; ;  [5] ;  [6] ; ;  [7]
  1. (Max-Planck-Institut fuer Chemie (Otto-Hahn-Institut), Mainz (Germany))
  2. (Univ. zu Koln, D-5000 Koln 41 (DE))
  3. (Inst. fur Kernphysik, KFA Julich, D-5170 Julich (DE))
  4. (San Jose State Univ., CA (United States))
  5. (National Aeronautics and Space Administration, Greenbelt, MD (United States). Goddard Space Flight Center)
  6. (Princeton Gamma-Tech, Princeton, NJ (US))
  7. (Los Alamos National Lab., NM (United States))
Publication Date:
OSTI Identifier:
5090247
Resource Type:
Journal Article
Resource Relation:
Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States); Journal Volume: 38:2
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; HIGH-PURITY GE DETECTORS; ANNEALING; RADIATION EFFECTS; SPACE FLIGHT; IRRADIATION; PROTONS; RESOLUTION; BARYONS; ELEMENTARY PARTICLES; FERMIONS; GE SEMICONDUCTOR DETECTORS; HADRONS; HEAT TREATMENTS; MEASURING INSTRUMENTS; NUCLEONS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; 440200* - Radiation Effects on Instrument Components, Instruments, or Electronic Systems