Diffraction of electrons at intermediate energies: The role of phonons

Journal Article · Mon Jul 01 00:00:00 EDT 1996 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.51179· OSTI ID:451077

Ascolani, H; Zampieri, G ^[1]

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1. Centro Atomico Bariloche e Instituto Balseiro, Comision Nacional de Energia Atomica, 8400-Bariloche (Argentina)

The intensity of electrons reflected {open_quote}{open_quote}elastically{close_quote}{close_quote} from crystalline surfaces presents two regimes: the low-energy or LEED regime ({lt}500 eV), in which the electrons are reflected along the Bragg directions, and the intermediate-energy or XPD/AED regime ({gt}500 eV), in which the maxima of intensity are along the main crystallographic axes. We present a model which explains this transition in terms of the excitation/absorption of phonons during the scattering. {copyright} {ital 1996 American Institute of Physics.}

• OSTI ID: 451077
• Report Number(s): CONF-9409431-; ISSN 0094-243X; TRN: 97:005609
• Journal Information: AIP Conference Proceedings, Vol. 378, Issue 1; Conference: Surfaces, vacuum and their applications, Cancun (Mexico), 19-23 Sep 1994; Other Information: PBD: Jul 1996
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
ELECTRON DIFFRACTION
INELASTIC SCATTERING
PHOTOEMISSION
AUGER EFFECT
BRAGG REFLECTION
PHONONS
ENERGY DEPENDENCE
EV RANGE
KEV RANGE 01-10