High critical current densities of YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} thin films on buffered technical substrates
- Forschungszentrum Karlsruhe, INFP and ITP, D 76021 Karlsruhe (Germany)
C-axis oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} (YBCO) thin films were deposited on polycrystalline metallic tapes buffered with yttria stabilized zirconia (YSZ). The in-plane alignment of the YSZ layers achieved by simultaneous ion bombardment of the growing film (ion beam assisted deposition) and of the postdeposited YBCO thin films was studied by x-ray diffraction as a function of the buffer layer thickness. A significant improvement of the in-plane texture, achieved for buffer layers exceeding a thickness of about 1.5 {mu}m, resulted in high critical current densities above 10{sup 6} A/cm{sup 2} of the YBCO films. {copyright} {ital 1997 American Institute of Physics.}
- OSTI ID:
- 450200
- Journal Information:
- Applied Physics Letters, Vol. 70, Issue 5; Other Information: PBD: Feb 1997
- Country of Publication:
- United States
- Language:
- English
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