Atomic data for lighting and astrophysical applications: Excited-state lifetimes and transition probabilities for rare-earth elements
- Univ. of Wisconsin, Madison, WI (United States). Physics Dept.
Because of the extremely rich spectra of rare-earth metals, a large volume of data for these elements is sought by the lighting industry for modeling of a new generation of High-Intensity Discharge lamps. In addition, the observation of rare-earths in the atmospheres of chemically peculiar stars means that this data is also of substantial interest to the astrophysics community. The authors are currently meeting this need with a combination of two experiments: excited-state lifetimes are obtained from laser-induced fluorescence measurements on a slow atomic/ionic beam, and branching fractions are obtained with a Fourier-transform spectrometer. These two sets of data are then combined to produce absolute transition probabilities. Obtaining high-quality data of this nature has involved the development of an appropriate atomic beam source, as well as a careful understanding and elimination of a variety of systematic effects. Current work has yielded preliminary lifetime measurements on more than 400 levels of neutral and singly-ionized Dysprosium, and will eventually continue with Holmium.
- OSTI ID:
- 435474
- Report Number(s):
- CONF-960634-; TRN: IM9710%%132
- Resource Relation:
- Conference: 1996 IEEE international conference on plasma science, Boston, MA (United States), 3-5 Jun 1996; Other Information: PBD: 1996; Related Information: Is Part Of IEEE conference record -- Abstracts: 1996 IEEE international conference on plasma science; PB: 324 p.
- Country of Publication:
- United States
- Language:
- English
Similar Records
Radiative transition probabilities of neutral and singly ionized rare earth elements (La, Ce, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu) estimated by laser-induced breakdown spectroscopy
Spectral, nuclear, and matrix interferences in the determination of rare earths in geologic specimens by neutron activation analysis