Silicone-polyoxometalate (SiPOM) hybrid compounds

Conference · Tue Dec 31 00:00:00 EST 1996

OSTI ID:427744

Katsoulis, D E; Keryk, J R ^[1]

---

1. Dow Corning Corp, Midland, MI (United States)

Oligomeric and polymeric SiPOM materials have been prepared by reacting trichloro endblocked PDMS [degree of polymerization, {approximately} 14 (I) and 60 (II)] with {alpha}-K{sub 8}SiW{sub 11}O{sub 39}. NMR and IR spectroscopy show that the POM units are bonded to the siloxane via Si-O-W bonds. The reaction of the short PDMS segment (I) with the POM produces powdery materials, (isolated as tetrabutylammonium salts) while the longer PDMS (II) forms elastomeric materials. For the latter the POM anions act as reinforcing fillers. Other important properties of the hybrid materials are their UV absorbency, their electrochromicity, their electrical properties (volume resistivity, {approximately} 10{sup 11} ohm{center_dot}cm; low loss tangent, memory capability) and their film formation.

• OSTI ID: 427744
• Report Number(s): CONF-960401-; ISBN 1-55899-338-X; TRN: IM9708%%71
• Resource Relation: Conference: Spring meeting of the Materials Research Society (MRS), San Francisco, CA (United States), 8-12 Apr 1996; Other Information: PBD: 1996; Related Information: Is Part Of Better ceramics through chemistry 7: Organic/inorganic hybrid materials; Coltrain, B.K. [ed.] [Eastman Kodak Co., Rochester, NY (United States)]; Sanchez, C. [ed.] [Univ. Pierre et Marie Curie, Paris (France)]; Schaefer, D.W. [ed.] [Sandia National Labs., Albuquerque, NM (United States)]; Wilkes, G.L. [ed.] [Virginia Polytechnic Inst. and State Univ., Blacksburg, VA (United States)]; PB: 695 p.; Materials Research Society symposium proceedings, Volume 435
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
TUNGSTEN COMPOUNDS
SYNTHESIS
MOLECULAR STRUCTURE
ELECTRICAL PROPERTIES
SILOXANES
POLYMERS
OXIDES
CHEMICAL BONDS
POWDERS
ELASTOMERS
NUCLEAR MAGNETIC RESONANCE
SILICON 29
TUNGSTEN 183
INFRARED SPECTRA
TRANSMISSION ELECTRON MICROSCOPY
CALORIMETRY
ABSORPTIVITY
ELECTRIC CONDUCTIVITY
ELECTROCHEMISTRY
THIN FILMS