Analytical electron microscopy of LDEF impactor residues
- Lockheed Engineering and Sciences Co., Houston, TX (United States)
The LDEF contained 57 individual experiment trays or tray portions specifically designed to characterize critical aspects of meteoroid and debris environment in low-Earth orbit (LEO). However, it was realized from the beginning that the most efficient use of the satellite would be to characterize impact features from the entire surface of the LDEF. With this in mind particular interest has focused on common materials facing in all 26 LDEF facing directions; among the most important of these materials has been the tray clamps. Therefore, in an effort to better understand the nature and flux of particulates in LEO, and their effects on spacecraft hardware, the authors are analyzing residues found in impact features on LDEF tray clamp surfaces. This paper summarizes all data from 79 clamps located on Bay A & B of the LDEF. The authors also describe current efforts to characterize impactor residues recovered from the impact craters, and they have found that a low, but significant, fraction of these residues have survived in a largely unmelted state. These residues can be characterized sufficiently to permit resolution of the impactor origin. The authors have concentrated on the residue from chondritic interplanetary dust particles (micrometeoroids), as these represent the harshest test of their analytical capabilities.
- Research Organization:
- NASA Langley Research Center, Hampton, VA (United States)
- OSTI ID:
- 42755
- Report Number(s):
- N-95-23796; NASA-CP-3275-PT-1; L-17430A-PT-1; NAS-1.55:3275-PT-1; CONF-9311137-; TRN: 9523832
- Resource Relation:
- Conference: 3. long duration exposure flight (LDEF) symposium, Williamsburg, VA (United States), 8-12 Nov 1993; Other Information: PBD: Feb 1995; Related Information: Is Part Of LDEF: 69 Months in Space. Third Post-Retrieval Symposium, part 1; Levine, A.S.; PB: [10] p.
- Country of Publication:
- United States
- Language:
- English
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