Defect images by planar ECT probe of meander-mesh coils

Journal Article · Sun Sep 01 00:00:00 EDT 1996 · IEEE Transactions on Magnetics

DOI:https://doi.org/10.1109/20.539300· OSTI ID:403366

Yamada, Sotoshi; Katou, Masaki; Iwahara, Masayoshi ^[1]; Dawson, F P ^[2]

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1. Kanazawa Univ. (Japan). Lab. of Magnetic Field Control and Applications
2. Univ. of Toronto, Ontario (Canada). Dept. of Electrical and Computer Engineering

This paper presents results pertaining to image data obtained from a planar meander-mesh coupled coil type ECT probe. The image data makes it possible to detect not only the existence of a defect but also to extract detailed information regarding the nature of the defect, such as its position, shape, length, and direction. In order to recognize a defect distinctly, the authors have fabricated the high sensitive planar coil which can be used to image a 2-D representation of the ECT signal. The relationships between the image pattern and defect shape are discussed.

• OSTI ID: 403366
• Report Number(s): CONF-960425-; ISSN 0018-9464; TRN: IM9651%%401
• Journal Information: IEEE Transactions on Magnetics, Vol. 32, Issue 5Pt2; Conference: 1996 IEEE international magnetics conference, Seattle, WA (United States), 9-12 Apr 1996; Other Information: PBD: Sep 1996
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES
EDDY CURRENT TESTING
PROBES
DATA ANALYSIS
IMAGE PROCESSING
DESIGN