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Title: 6 GeV synchrotron x-ray source: Conceptual design report. Supplement B - conceptual design of proposed beam lines for the 6 GeV light source

In this document, preliminary conceptual designs are presented for ten sample beamlines for the 6 GeV Light Source. These beamlines will accommodate investigations in solid-state physics, materials science, materials technology, chemical technology, and biological and medical sciences. In future, the designs will be altered to include new developments in x-ray optics and hardware technologies. The research areas addressed by the samples beamlines are as follows: Topography and Radiography/Tomography (section 2); Inelastic Scattering with Ultrahigh Energy Resolution (Section 3); Surface and Bulk Studies Using High Momentum Resolution (Section 4); Inelastic Scattering from Charge and Spin (Section 5); Advanced X-Ray Photoelectron Spectroscopy Studies (Section 6); Small Angle X-Ray Scattering Studies (Section 7); General Purpose Scattering for Materials Studies (Section 8); Multiple-Energy Anomalous-Dispersion Studies of Proteins (Section 9); Protein Crystallography (Section 10); Time- and Space-resolved X-Ray Spectroscopy (Section 11); Medical Diagnostic Facility (Section 12); and Transuranium Research Facility (Section 13). The computer systems to be used on the beamlines are also discussed in Section 14 of this document.
Publication Date:
OSTI Identifier:
374134
Report Number(s):
LS-51(ANL)
ON: DE96014967; TRN: 96:005305
DOE Contract Number:
W-31109-ENG-38
Resource Type:
Technical Report
Resource Relation:
Other Information: PBD: Mar 1996
Research Org:
Argonne National Lab., IL (United States)
Sponsoring Org:
USDOE, Washington, DC (United States)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; SYNCHROTRON RADIATION SOURCES; USES; DESIGN; TOMOGRAPHY; INELASTIC SCATTERING; PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROSCOPY; X-RAY DIFFRACTION; CRYSTALLOGRAPHY; BEAM TRANSPORT