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Title: Transient power supply voltage (v{sub DDT}) analysis for detecting IC defects

Transient power supply voltage (V{sub DDT}) analysis is a new testing technique demonstrated as a powerful alternative and complement to I{sub DDQ} testing. V{sub DDT} takes advantage of the limited response time of a voltage supply to the changing power demands of an IC during operation. Changes in the V{sub DD} response time are used to detect increases in power demand with resolutions of 100 nA at 100 kHz, 1 {mu}A at 1 MHz, and 2.5 {mu}A at 1.5 MHz. These current sensitivities have been shown for ICs with quiescent currents < 0.1 {mu}A and > 300 {mu}A. The V{sub DDT} signal acquisition protocols, frequency versus sensitivity tradeoffs, hardware considerations and limitations, data examples, and areas for future research are described.
Authors:
; ;  [1]
  1. and others
Publication Date:
OSTI Identifier:
351426
Report Number(s):
SAND--97-0797C; CONF-971122--1
ON: DE97005158; TRN: 97:003828
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: IEEE Computer Society international test conference, Washington, DC (United States), 3-5 Nov 1997; Other Information: PBD: 1997
Research Org:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Org:
USDOE, Washington, DC (United States)
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES; INTEGRATED CIRCUITS; ELECTRICAL TESTING; POWER SUPPLIES; FAILURE MODE ANALYSIS; VOLTAGE DROP