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Title: RBS and GAXRD contributions to yttrium implanted extra low carbon steel characterization

Abstract

Extra low carbon steel samples were yttrium implanted using an ion implantation method. Composition and structural studies were carried out before and after yttrium implantations by several analytical and structural techniques (Rutherford backscattering spectrometry, reflection high energy electron diffraction, scanning electron microscopy, X-ray diffraction, and glancing angle X-ray diffraction) to characterize the yttrium implantation effect on extra low carbon steel. The aim of this article is to show the contributions of Rutherford back-scattering spectrometry (RBS) and glancing angle X-ray diffraction (GAXRD) to the determination of yttrium depth profiles in the samples. The results obtained by these techniques are compared to those of the other analyses performed in this work to show the existing correlation between composition and structural studies. Their results allow a better understanding of the effect of yttrium implantation in extra low carbon steel before studying their corrosion resistance at high temperature.

Authors:
;  [1]; ;  [2]
  1. Equipe Locale Univ. Blaise Pascal Clermont-Fd II, Le Puy en Velay (France). Lab. Vellave d`Elaboration et d`Etude des Materiaux
  2. European Commission, Ispra (Italy). Inst. for Advanced Materials
Publication Date:
OSTI Identifier:
349853
Resource Type:
Journal Article
Journal Name:
Materials Characterization
Additional Journal Information:
Journal Volume: 42; Journal Issue: 2-3; Other Information: PBD: Feb-Mar 1999
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; MICROSTRUCTURE; ION IMPLANTATION; CARBON STEELS; YTTRIUM ADDITIONS; CHEMICAL COMPOSITION; RUTHERFORD SCATTERING; X-RAY DIFFRACTION; CORRELATIONS

Citation Formats

Caudron, E, Buscail, H, Jacob, Y P, and Stroosnijder, M F. RBS and GAXRD contributions to yttrium implanted extra low carbon steel characterization. United States: N. p., 1999. Web. doi:10.1016/S1044-5803(98)00058-8.
Caudron, E, Buscail, H, Jacob, Y P, & Stroosnijder, M F. RBS and GAXRD contributions to yttrium implanted extra low carbon steel characterization. United States. https://doi.org/10.1016/S1044-5803(98)00058-8
Caudron, E, Buscail, H, Jacob, Y P, and Stroosnijder, M F. 1999. "RBS and GAXRD contributions to yttrium implanted extra low carbon steel characterization". United States. https://doi.org/10.1016/S1044-5803(98)00058-8.
@article{osti_349853,
title = {RBS and GAXRD contributions to yttrium implanted extra low carbon steel characterization},
author = {Caudron, E and Buscail, H and Jacob, Y P and Stroosnijder, M F},
abstractNote = {Extra low carbon steel samples were yttrium implanted using an ion implantation method. Composition and structural studies were carried out before and after yttrium implantations by several analytical and structural techniques (Rutherford backscattering spectrometry, reflection high energy electron diffraction, scanning electron microscopy, X-ray diffraction, and glancing angle X-ray diffraction) to characterize the yttrium implantation effect on extra low carbon steel. The aim of this article is to show the contributions of Rutherford back-scattering spectrometry (RBS) and glancing angle X-ray diffraction (GAXRD) to the determination of yttrium depth profiles in the samples. The results obtained by these techniques are compared to those of the other analyses performed in this work to show the existing correlation between composition and structural studies. Their results allow a better understanding of the effect of yttrium implantation in extra low carbon steel before studying their corrosion resistance at high temperature.},
doi = {10.1016/S1044-5803(98)00058-8},
url = {https://www.osti.gov/biblio/349853}, journal = {Materials Characterization},
number = 2-3,
volume = 42,
place = {United States},
year = {Mon Feb 01 00:00:00 EST 1999},
month = {Mon Feb 01 00:00:00 EST 1999}
}