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Title: Nondestructive measurements of complex tensor permittivity of anisotropic materials using a waveguide probe system

Abstract

A nondestructive measurement of electromagnetic (EM) properties of anisotropic materials using an open-ended waveguide probe has been conducted. Two coupled electric field integral equations (EFIEs) for the aperture electric field are derived and solved numerically by employing the method of moments (MoM). After the determination of the aperture electric field, the reflection coefficient of the incident wave can be expressed in terms of the EM parameters of the material. Then, the EM parameters of the material layer can be inversely determined if the reflection coefficient of the incident wave is experimentally measured. A series of experiments has been conducted using the waveguide probe system constructed at MSU electromagnetics laboratory. The inverse results of the EM properties of various materials are presented. Finally, the effects of material parameters on the probe input admittance that cause problems in the measurement are analyzed.

Authors:
;  [1];  [2]
  1. Michigan State Univ., East Lansing, MI (United States). Dept. of Electrical Engineering
  2. Nanjing Univ. (China). Dept. of Electronic Science and Engineering
Publication Date:
OSTI Identifier:
282408
Resource Type:
Journal Article
Journal Name:
IEEE Transactions on Microwave Theory and Techniques
Additional Journal Information:
Journal Volume: 44; Journal Issue: 7Pt1; Other Information: PBD: Jul 1996
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES; MATERIALS; NONDESTRUCTIVE TESTING; PHYSICAL PROPERTIES; MOMENTS METHOD; ELECTROMAGNETIC FIELDS; NUMERICAL SOLUTION

Citation Formats

Chang, C W, Chen, K M, and Qian, J. Nondestructive measurements of complex tensor permittivity of anisotropic materials using a waveguide probe system. United States: N. p., 1996. Web. doi:10.1109/22.508641.
Chang, C W, Chen, K M, & Qian, J. Nondestructive measurements of complex tensor permittivity of anisotropic materials using a waveguide probe system. United States. https://doi.org/10.1109/22.508641
Chang, C W, Chen, K M, and Qian, J. 1996. "Nondestructive measurements of complex tensor permittivity of anisotropic materials using a waveguide probe system". United States. https://doi.org/10.1109/22.508641.
@article{osti_282408,
title = {Nondestructive measurements of complex tensor permittivity of anisotropic materials using a waveguide probe system},
author = {Chang, C W and Chen, K M and Qian, J},
abstractNote = {A nondestructive measurement of electromagnetic (EM) properties of anisotropic materials using an open-ended waveguide probe has been conducted. Two coupled electric field integral equations (EFIEs) for the aperture electric field are derived and solved numerically by employing the method of moments (MoM). After the determination of the aperture electric field, the reflection coefficient of the incident wave can be expressed in terms of the EM parameters of the material. Then, the EM parameters of the material layer can be inversely determined if the reflection coefficient of the incident wave is experimentally measured. A series of experiments has been conducted using the waveguide probe system constructed at MSU electromagnetics laboratory. The inverse results of the EM properties of various materials are presented. Finally, the effects of material parameters on the probe input admittance that cause problems in the measurement are analyzed.},
doi = {10.1109/22.508641},
url = {https://www.osti.gov/biblio/282408}, journal = {IEEE Transactions on Microwave Theory and Techniques},
number = 7Pt1,
volume = 44,
place = {United States},
year = {Mon Jul 01 00:00:00 EDT 1996},
month = {Mon Jul 01 00:00:00 EDT 1996}
}