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Title: Sign reversal of the Hall resistivity of single-crystalline Bi{sub 1.95}Sr{sub 1.65}La{sub 0.4}CuO{sub 6+{delta}} and Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub 8+{delta}}

Journal Article · · Physical Review, B: Condensed Matter
;  [1]
  1. Laboratorium fuer Festkoerperphysik, Eidgenoessische Technische Hochschule Hoenggerberg, CH-8093 Zuerich (Switzerland)

The Hall effect of single-crystalline Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub 8+{delta}} and Bi{sub 1.95}Sr{sub 1.65}La{sub 0.4}CuO{sub 6+{delta}} has been measured above and below the superconducting transition temperature {ital T}{sub {ital c}0} by applying magnetic fields {bold H}{parallel}{ital c} and currents {ital I}{perpendicular}{ital c}, where {ital c} denotes the direction perpendicular to the Cu-O planes of these materials. For both compounds, the Hall resistivity {rho}{sub {ital xy}}({ital T},{bold H}) reveals similar temperature and field dependences. As {ital T} approaches {ital T}{sub {ital c}0} from higher temperatures, the {rho}{sub {ital xy}}({ital T},{bold H}) versus {bold H} curves gradually deviate from linearity and exhibit an unusual sign reversal in the low-field regime. The total Hall resistivity {rho}{sub {ital xy}}({ital T},{bold H}) may be decomposed into three distinctly different terms, i.e., {rho}{sub {ital xy}}({ital T},{ital H})={rho}{sub {ital xy}}{sup 0}({ital T})+{ital R}{sub {ital H}}{sup {prime}}({ital T}) H{ital H}+{rho}{sub {ital xy}}{sup {ital x}}({ital T},{ital H}). The contribution {rho}{sup {ital x}}{sub {ital xy}}({ital T},{bold H}), representing the deviation of {rho}{sub {ital xy}}({ital T},{bold H}) from {bold H} linearity, exhibits a universal scaling behavior as a function of {bold H}/{bold H}{sub 0}({ital T}) for fields between 0 and {bold H}{sub 0}({ital T}), the field below which {rho}{sub {ital xy}}({ital T},{bold H}) is no longer linear in {bold H}. {copyright} {ital 1996 The American Physical Society.}

OSTI ID:
280202
Journal Information:
Physical Review, B: Condensed Matter, Vol. 53, Issue 14; Other Information: PBD: Apr 1996
Country of Publication:
United States
Language:
English