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Title: Effects of passing electric current on the elastic property of amorphous Cu{sub 50}Zr{sub 50} and Cu{sub 50}Ti{sub 50}

Journal Article · · Acta Materialia
; ;  [1]
  1. Univ. of Tsukuba, Ibaraki (Japan). Inst. of Materials Science

For both amorphous Cu{sub 50}Zr{sub 50} and Cu{sub 50}Ti{sub 50}, the dynamic Young`s modulus M was found to increase under passing electric d.c.-current (PEC) with the current density i{sub d} below 5 {times} 10{sup 3} A/cm{sup 2}, suggesting that PEC induces internal stress. The i{sub d} dependence of M observed at low strain amplitude {epsilon}{sub t} was found to be identical to the {epsilon}{sub t} dependence of M without PEC after scaling between i{sub d} and {epsilon}{sub t}, giving Z* in the order of 10{sup 5}, where Z* is the apparent charge number measuring the electromigration force (EM-force) under PEC. The authors surmise that such a large Z* reflects the concentration of EM-force through the collective motion of many atoms, Z* = z*{xi}, for {xi} atoms with the charge number z* per atom. Application of this view to the observed effect of annealing on Z* gives {xi} as several hundreds in the as-quenched state. Based on the present results, the effects of PEC on the structural relaxation and crystallization processes reported are also discussed.

OSTI ID:
264100
Journal Information:
Acta Materialia, Vol. 44, Issue 7; Other Information: PBD: Jul 1996
Country of Publication:
United States
Language:
English