Anomalous scattering, transport, and spatial distribution of X-ray fluorescence at the exit of polycapillary structures

Journal Article · Thu Dec 15 00:00:00 EST 2016 · Journal of Experimental and Theoretical Physics

DOI:https://doi.org/10.1134/S1063776116130082· OSTI ID:22617120

Lerer, A. M.; Makhno, P. V. ^[1]

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1. Southern Federal University (Russian Federation)

The angular distribution of the X-ray intensity at the exit of microchannel plates at grazing incidence of monochromatic radiation on the walls of microcapillaries has been investigated. The angles and energies of the primary radiation quanta at which the synchrotron beam excites X-ray fluorescence propagating inside polycapillary structures have been determined. The angular dependences of the intensity distribution of X-rays transmitted through the microcapillaries have been studied theoretically and experimentally for energies corresponding to the region of anomalous dispersion near the L{sub 2,3} absorption edges of silicon. The propagation of waves in hollow polycapillary waveguides, the excitation of X-ray fluorescence, and the X-ray diffraction at the exit of microchannel plates have been modeled mathematically. The mathematical model takes into account the presence of a transition layer on the microchannel surface.

• OSTI ID: 22617120
• Journal Information: Journal of Experimental and Theoretical Physics, Vol. 123, Issue 6; Other Information: Copyright (c) 2016 Pleiades Publishing, Inc.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7761
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION
ANGULAR DISTRIBUTION
BEAMS
DISPERSIONS
EXCITATION
FLUORESCENCE
LAYERS
MICROCHANNEL ELECTRON MULTIPLIERS
MONOCHROMATIC RADIATION
SILICON
SIMULATION
SPATIAL DISTRIBUTION
SURFACES
SYNCHROTRON RADIATION
WAVEGUIDES
X RADIATION
X-RAY DIFFRACTION