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Title: Apertureless SPM method of light detection

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4954336· OSTI ID:22609112
; ;  [1]; ; ; ;  [2]
  1. Ioffe Institute, Saint-Petersburg 194021 (Russian Federation)
  2. Institute of Electronics and Systems, CNRS UMR 5214, University of Montpellier, 34095 Montpellier (France)

We demonstrate the effect of infrared (IR) illumination on mechanical resonance frequency of scanning probe microscope (SPM) probe. The analytical estimations permit to relate the observed effect with the SPM-probe heating by IR-radiation. This effect can be used for the SPM mapping of IR-radiation spatial distribution on the emitting surfaces. The proposed method demonstrates high sensitivity to the infrared radiation and lateral resolution in the sub-micron range. It was applied to visualize complex spatial structure of lasing modes on the mirror of whispering-gallery mode GaSb/GaAlAsSb/GaInAsSb laser.

OSTI ID:
22609112
Journal Information:
AIP Conference Proceedings, Vol. 1748, Issue 1; Conference: STRANN 2016: 5. international conference on state-of-the-art trends of scientific research of artificial and natural nanoobjects, St. Petersburg (Russian Federation), 26-29 Apr 2016; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English