Structural and morphological studies on Bi{sub 1-x}Ca{sub x}MnO{sub 3} thin films grown by RF magnetron sputtering

Journal Article · Mon May 23 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4947942· OSTI ID:22608713

Pugazhvadivu, K. S.; Santhiya, M.; Balakrishnan, L. ^[1]

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1. Materials Physics Division, School of Advanced Sciences, VIT University, Vellore 632 014 (India)

Bi{sub 1-x}Ca{sub x}MnO{sub 3} (0 ≤ X ≤ 0.4) thin films are deposited on n–type Si (100) substrate at 800 °C by RF magnetron sputtering. X-ray diffraction pattern shows that the films are crystallized in monoclinic structure with C2 space group. The crystallite size and induced strain in the prepared films are measured by W-H plot. The cell parameters and texture coefficient of the films are calculated. The surface morphology of the films is examined by atomic force microscope. The study confirms the optimum level of calcium doping is 20 at. % in Bi site of BiMnO{sub 3} film, these findings pave the way for further research in the Ca modified BiMnO{sub 3} films towards device fabrication.

• OSTI ID: 22608713
• Journal Information: AIP Conference Proceedings, Vol. 1731, Issue 1; Conference: DAE solid state physics symposium 2015, Uttar Pradesh (India), 21-25 Dec 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ATOMIC FORCE MICROSCOPY
BISMUTH COMPOUNDS
CALCIUM
CALCIUM COMPOUNDS
MAGNETRONS
MANGANATES
MICROSTRUCTURE
MONOCLINIC LATTICES
N-TYPE CONDUCTORS
SILICON
SPACE GROUPS
SPUTTERING
STRAINS
SUBSTRATES
SURFACES
TEXTURE
THIN FILMS
X-RAY DIFFRACTION