Raman spectroscopic investigations of tetragonal to cubic transition in BaTiO{sub 3} films grown on LaAlO{sub 3} substrate

Journal Article · Mon May 23 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4947898· OSTI ID:22608673

Kumar, Satish; Kumar, Dhirendra; Rathore, Ajay Kumar; Sathe, V. G. ^[1]

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1. UGC-DAE –Consortium for Scientific Research, DAVV campus Khandwa Road Indore-452001 (M.P.) (India)

BaTiO{sub 3} [BTO] films have been grown on LaAlO{sub 3} (LAO) substrate using pulse laser deposition technique. The film is found highly oriented, possess 400 nm thickness and single phase in nature. However, the out-of-plane lattice parameter of the film obtained from the x-ray diffraction was found to be lower when compared to bulk compound indicating towards strain reversal. The Raman spectra recorded at room temperature showed that the film is tetragonal with C4v symmetry. Raman spectra collected at high temperatures for the film and the bulk compound showed that the tetragonal to cubic transition temperature in film is enhanced by 100 K.

• OSTI ID: 22608673
• Journal Information: AIP Conference Proceedings, Vol. 1731, Issue 1; Conference: DAE solid state physics symposium 2015, Uttar Pradesh (India), 21-25 Dec 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALUMINATES
BARIUM COMPOUNDS
CRYSTAL GROWTH
CRYSTAL-PHASE TRANSFORMATIONS
ENERGY BEAM DEPOSITION
FILMS
LANTHANUM COMPOUNDS
LANTHANUM OXIDES
LASER RADIATION
LATTICE PARAMETERS
RAMAN SPECTRA
STRAINS
SUBSTRATES
SYMMETRY
TEMPERATURE RANGE 0273-0400 K
THICKNESS
TITANATES
TRANSITION TEMPERATURE
X-RAY DIFFRACTION