Sequential x-ray diffraction topography at 1-BM x-ray optics testing beamline at the advanced photon source

Journal Article · Wed Jul 27 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4952940· OSTI ID:22608444

Stoupin, Stanislav; Shvyd’ko, Yuri; Trakhtenberg, Emil; Liu, Zunping; Lang, Keenan; Huang, Xianrong; Wieczorek, Michael; Kasman, Elina; Hammonds, John; Macrander, Albert; Assoufid, Lahsen ^[1]

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1. Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)

We report progress on implementation and commissioning of sequential X-ray diffraction topography at 1-BM Optics Testing Beamline of the Advanced Photon Source to accommodate growing needs of strain characterization in diffractive crystal optics and other semiconductor single crystals. The setup enables evaluation of strain in single crystals in the nearly-nondispersive double-crystal geometry. Si asymmetric collimator crystals of different crystallographic orientations were designed, fabricated and characterized using in-house capabilities. Imaging the exit beam using digital area detectors permits rapid sequential acquisition of X-ray topographs at different angular positions on the rocking curve of a crystal under investigation. Results on sensitivity and spatial resolution are reported based on experiments with high-quality Si and diamond crystals. The new setup complements laboratory-based X-ray topography capabilities of the Optics group at the Advanced Photon Source.

• OSTI ID: 22608444
• Journal Information: AIP Conference Proceedings, Vol. 1741, Issue 1; Conference: SRI2015: 12. international conference on synchrotron radiation instrumentation, New York, NY (United States), 6-10 Jul 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ADVANCED PHOTON SOURCE
ASYMMETRY
BEAM OPTICS
COLLIMATORS
COMMISSIONING
CRYSTALLOGRAPHY
DESIGN
DIAMONDS
MONOCRYSTALS
NEUTRON DIFFRACTION
ORIENTATION
PHOTONS
SENSITIVITY
SPATIAL RESOLUTION
STRAINS
TOPOGRAPHY
X RADIATION
X-RAY DIFFRACTION