Current-limiting and ultrafast system for the characterization of resistive random access memories

Journal Article · Wed Jun 15 00:00:00 EDT 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4954973· OSTI ID:22597901

Maestro, M.; Martin-Martinez, J.; Crespo-Yepes, A.; Rodriguez, R.; Nafria, M.; Aymerich, X. ^[1]

---

1. Departament d’Enginyeria Electrònica, Universitat Autònoma de Barcelona (UAB), Bellaterra (Spain)

A new system for the ultrafast characterization of resistive switching phenomenon is developed to acquire the current during the Set and Reset process in a microsecond time scale. A new electronic circuit has been developed as a part of the main setup system, which is capable of (i) applying a hardware current limit ranging from nanoampers up to miliampers and (ii) converting the Set and Reset exponential gate current range into an equivalent linear voltage. The complete system setup allows measuring with a microsecond resolution. Some examples demonstrate that, with the developed setup, an in-depth analysis of resistive switching phenomenon and random telegraph noise can be made.

• OSTI ID: 22597901
• Journal Information: Review of Scientific Instruments, Vol. 87, Issue 6; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CURRENTS
DEPTH
ELECTRIC POTENTIAL
ELECTRONIC CIRCUITS
NOISE
RANDOMNESS
RESOLUTION