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Title: Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering

Abstract

Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Here we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.

Authors:
 [1]; ; ;  [2];  [1];  [1]
  1. Department of Physics, Western Michigan University, Kalamazoo, Michigan 49008-5252 (United States)
  2. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Publication Date:
OSTI Identifier:
22597676
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 8; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ATOMS; EXCITATION; FABRICATION; POLARIZATION; PROBES; SILICON; SURFACES; SYMMETRY; TRANSITION ELEMENTS; X RADIATION; X-RAY DIFFRACTION

Citation Formats

Gao, Xuan, Key Laboratory of Multi-scale Manufacturing Technology, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 400714, Casa, Diego, Kim, Jungho, Gog, Thomas, Li, Chengyang, Department of Physics, South University of Science and Technology of China, Shenzhen 518055, and Burns, Clement. Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering. United States: N. p., 2016. Web. doi:10.1063/1.4959566.
Gao, Xuan, Key Laboratory of Multi-scale Manufacturing Technology, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 400714, Casa, Diego, Kim, Jungho, Gog, Thomas, Li, Chengyang, Department of Physics, South University of Science and Technology of China, Shenzhen 518055, & Burns, Clement. Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering. United States. https://doi.org/10.1063/1.4959566
Gao, Xuan, Key Laboratory of Multi-scale Manufacturing Technology, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 400714, Casa, Diego, Kim, Jungho, Gog, Thomas, Li, Chengyang, Department of Physics, South University of Science and Technology of China, Shenzhen 518055, and Burns, Clement. 2016. "Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering". United States. https://doi.org/10.1063/1.4959566.
@article{osti_22597676,
title = {Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering},
author = {Gao, Xuan and Key Laboratory of Multi-scale Manufacturing Technology, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 400714 and Casa, Diego and Kim, Jungho and Gog, Thomas and Li, Chengyang and Department of Physics, South University of Science and Technology of China, Shenzhen 518055 and Burns, Clement},
abstractNote = {Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Here we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.},
doi = {10.1063/1.4959566},
url = {https://www.osti.gov/biblio/22597676}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 8,
volume = 87,
place = {United States},
year = {Mon Aug 15 00:00:00 EDT 2016},
month = {Mon Aug 15 00:00:00 EDT 2016}
}

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