A classification scheme for edge-localized modes based on their probability distributions
- Department of Applied Physics, Ghent University, B-9000 Ghent (Belgium)
We present here an automated classification scheme which is particularly well suited to scenarios where the parameters have significant uncertainties or are stochastic quantities. To this end, the parameters are modeled with probability distributions in a metric space and classification is conducted using the notion of nearest neighbors. The presented framework is then applied to the classification of type I and type III edge-localized modes (ELMs) from a set of carbon-wall plasmas at JET. This provides a fast, standardized classification of ELM types which is expected to significantly reduce the effort of ELM experts in identifying ELM types. Further, the classification scheme is general and can be applied to various other plasma phenomena as well.
- OSTI ID:
- 22596621
- Journal Information:
- Review of Scientific Instruments, Vol. 87, Issue 11; Other Information: (c) 2016 EURATOM; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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