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Title: Electron energy loss spectroscopy of excitons in two-dimensional-semiconductors as a function of temperature

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4947058· OSTI ID:22591612
 [1]; ;  [2]; ;  [3]
  1. Laboratoire de Physique des Solides, Université Paris-Sud, CNRS-UMR 8502, Orsay 91405 (France)
  2. Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565 (Japan)
  3. Physical Science and Engineering Division, King Abdullah University of Science and Technology, Thuwal 23955-6900 (Saudi Arabia)

We have explored the benefits of performing monochromated Electron Energy Loss Spectroscopy (EELS) in samples at cryogenic temperatures. As an example, we have observed the excitonic absorption peaks in single layer Transition Metal Dichalcogenides. These peaks appear separated by small energies due to spin orbit coupling. We have been able to distinguish the split for MoS{sub 2} below 300 K and for MoSe{sub 2} below 220 K. However, the distinction between peaks is only clear at 150 K. We have measured the change in absorption threshold between 150 K and 770 K for MoS{sub 2} and MoSe{sub 2}. We discuss the effect of carbon and ice contamination in EELS spectra. The increased spectral resolution available made possible with modern monochromators in electron microscopes will require the development of stable sample holders which reaches temperatures far below that of liquid nitrogen.

OSTI ID:
22591612
Journal Information:
Applied Physics Letters, Vol. 108, Issue 16; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English