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Title: Dielectric studies of boron sub phthalocyanine chloride thin films by admittance spectroscopic techniques

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4946328· OSTI ID:22591398
;  [1]; ; ; ;  [2]
  1. Department of Physics, DAV College, Amritsar-143301 (India)
  2. Material Research Laboratory, Department of Physics, Guru Nanak Dev University, Amritsar-143005 (India)

The dielectric properties of Boron Sub Phthalocyanine Chloride (Cl-SubPc) thermally deposited on ITO substrate have been studied using admittance spectroscopic techniques. The I-V and capacitance –frequency (C-F) studies at various bias voltages reveal that the mobility of charge carriers decrease with bias voltage, however the conduction phenomenon still remain hopping in nature. From the differential susceptance curve, the contribution of the Schottky barrier contact in the charge carrier concentration was found to be absent. The mobility of charge carriers have been determined using differential susceptance variation and from the phase of admittance curve. The values obtained in two cases have been found to be in agreement with each other.

OSTI ID:
22591398
Journal Information:
AIP Conference Proceedings, Vol. 1728, Issue 1; Conference: ICC 2015: International conference on condensed matter and applied physics, Bikaner (India), 30-31 Oct 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English