High temperature X-ray diffraction, Raman spectroscopy and dielectric studies on yttrium orthochromites
- Department of Materials Science and Engineering, Indian Institute of Technology Kanpur, Kanpur 208 016 (India)
- Materials Science Programme, Indian Institute of Technology Kanpur, Kanpur 208 016 (India)
The structural, thermal and dielectric properties of YCrO{sub 3} ceramic prepared by solid state reaction method have been investigated by a combination of XRD, Raman spectroscopy and permittivity measurement. The X-ray diffraction spectra shows single phase orthorhombically distorted perovskite structure with Pnma symmetry over a wide range of temperature 300K to 1100K. Impedance spectroscopy study on the sample showed that the dielectric constant, tangent loss and ac conductivity with frequency increases on increasing the temperature. Dielectric measurement shows a relaxor like transition at about 460K. Non-Debye type relaxation is observed with activation energy of 0.25 eV extracted from ac conductivity at 11 kHz frequency. We believe that the oxygen ion vacancies play an important role in conduction processes in addition to polaron hopping at higher temperatures. Raman scattering measurements were performed over a wide temperature range from 300K to 600 K. The line width of the modes due to CrO{sub 6} bending and in-plane O{sub 2} stretching broadens with increasing temperature.
- OSTI ID:
- 22591371
- Journal Information:
- AIP Conference Proceedings, Vol. 1728, Issue 1; Conference: ICC 2015: International conference on condensed matter and applied physics, Bikaner (India), 30-31 Oct 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ACTIVATION ENERGY
CERAMICS
DIELECTRIC MATERIALS
ELECTRIC CONDUCTIVITY
IMPEDANCE
KHZ RANGE
LINE WIDTHS
ORTHORHOMBIC LATTICES
OXYGEN IONS
PERMITTIVITY
POLARONS
RAMAN SPECTROSCOPY
RELAXATION LOSSES
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE 0400-1000 K
VACANCIES
X-RAY DIFFRACTION