Structural studies of zirconium doped Ba{sub 0.70}Sr{sub 0.30}TiO{sub 3} lead free ferroelectric thin films

Journal Article · Fri May 06 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4946243· OSTI ID:22591340

Sharma, Sarita; Ram, Mast; Thakur, Shilpa; Sharma, Hakikat; Negi, N. S. ^[1]

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1. Department of Physics Himachal Pradesh University Shimla (H.P.) India (India)

Ba{sub 0.7}Sr{sub 0.3}(Zr{sub x}Ti{sub 1-x})O{sub 3}(BSZT, x=0,0.05,0.10,0.15,0.20) thin films were prepared by using sol gel method. Structural and microstructural properties were studied by using XRD, Raman Spectroscopy and atomic force microscopy (AFM) respectively. XRD and Raman Spectroscopy show the presence of tetragonal phase in multilayer BSZT thin film. The experimental results demonstrate that structural and microstructural properties of BSZT thin film were significantly dependent on variation of Zr content.

• OSTI ID: 22591340
• Journal Information: AIP Conference Proceedings, Vol. 1728, Issue 1; Conference: ICC 2015: International conference on condensed matter and applied physics, Bikaner (India), 30-31 Oct 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ATOMIC FORCE MICROSCOPY
BARIUM COMPOUNDS
CONCENTRATION RATIO
DOPED MATERIALS
FERROELECTRIC MATERIALS
LAYERS
MICROSTRUCTURE
RAMAN SPECTROSCOPY
SOL-GEL PROCESS
STRONTIUM TITANATES
TETRAGONAL LATTICES
THIN FILMS
X-RAY DIFFRACTION
ZIRCONIUM COMPOUNDS