Chemical bath deposition of Cu{sub 3}BiS{sub 3} thin films
- Department of Applied Physics, Sardar Vallabhbhai National Institute of Technology, Ichchhanath, Surat (India)
- Department of Electrical Engineering, Sardar Vallabhbhai National Institute of Technology, Ichchhanath, Surat (India)
First time, copper bismuth sulfide (Cu{sub 3}BiS{sub 3}) thin films were synthesized on the glass substrate using simple, low-cost chemical bath deposition (CBD) technique. The synthesized parameters such as temperature of bath, pH and concentration of precursors were optimized for the deposition of uniform, well adherent Cu{sub 3}BiS{sub 3} thin films. The optical, surface morphology and structural properties of the Cu{sub 3}BiS{sub 3} thin films were studied using UV-VIS-NIR spectra, scanning electron microscopy (SEM) and X-ray diffraction (XRD). The as- synthesized Cu{sub 3}BiS{sub 3} film exhibits a direct band gap 1.56 to 1.58 eV having absorption coefficient of the order of 10{sup 5} cm{sup −1}. The XRD declares the amorphous nature of the films. SEM images shows films were composed of close-packed fine spherical nanoparticles of 70-80 nm in diameter. The chemical composition of the film was almost stoichiometric. The optical study indicates that the Cu{sub 3}BiS{sub 3} films can be applied as an absorber layer for thin film solar cells.
- OSTI ID:
- 22591231
- Journal Information:
- AIP Conference Proceedings, Vol. 1728, Issue 1; Conference: ICC 2015: International conference on condensed matter and applied physics, Bikaner (India), 30-31 Oct 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ABSORPTION SPECTRA
BISMUTH SULFIDES
CHEMICAL COMPOSITION
CONCENTRATION RATIO
COPPER COMPOUNDS
DEPOSITION
ENERGY GAP
GLASS
IMAGES
LAYERS
MORPHOLOGY
NANOPARTICLES
PH VALUE
SCANNING ELECTRON MICROSCOPY
SOLAR CELLS
SPHERICAL CONFIGURATION
STOICHIOMETRY
SUBSTRATES
THIN FILMS
X-RAY DIFFRACTION