Improvement microstructural and damage characterization of ceramic composites Y{sub 2}O{sub 3} – V{sub 2}O{sub 5} with MgO nano particles

Journal Article · Thu Apr 21 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4945967· OSTI ID:22591207

Hasan, J. M.; Abdullah, E. T. ^[1]; Shokr, F. S. ^[2]

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1. University of Baghdad, College of Science, Physics Department, Jaderiha, Baghdad (Iraq)
2. King Abdul Aziz Universit, Faculty of Science&Art, Physics Department, Rabigh, KSA (Saudi Arabia)

Compacted samples of Y{sub 2}O{sub 3}-V{sub 2}O{sub 5} – MgO Nano – particles wt. % sintered at different sintering temperature (700, 900, 1100, 1300) ) C° for 2 hours under static air were investigated by x-ray diffraction and differential thermal analysis(DTA), to identify the phase present .Microstructure examination achieved by scanning electron microscopy .Sintered density and porosity were measured for all sintered samples .Compression was tested too and the Brake down voltage and dielectric strength were measure for all sintered samples .The clear improvement were noticed in both microstructure and damage characterization respectively after existing the MgO Nano-particles, by increasing in about 30% in sintered density and 25% for the compressive strength .The improvement also noticed on both brake down voltage and dielectric strength.

• OSTI ID: 22591207
• Journal Information: AIP Conference Proceedings, Vol. 1727, Issue 1; Conference: APMAS '15): 5. international advances in applied physics and materials science congress and exhibition, Oludeniz (Turkey), 16-19 Apr 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CERAMICS
COMPRESSION
COMPRESSION STRENGTH
DENSITY
DIELECTRIC MATERIALS
DIFFERENTIAL THERMAL ANALYSIS
MAGNESIUM OXIDES
MICROSTRUCTURE
NANOPARTICLES
POROSITY
SCANNING ELECTRON MICROSCOPY
SINTERING
TEMPERATURE DEPENDENCE
VANADIUM OXIDES
X-RAY DIFFRACTION
YTTRIUM OXIDES