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Title: Physical properties of a non-transparent cadmium oxide thick film deposited at low fluence by pulsed laser deposition

Journal Article · · Materials Research Bulletin
 [1];  [2];  [3];
  1. Facultad de Ciencias Físico-Matemáticas, Postgrado en Física Aplicada, Benemérita Universidad Autónoma de Puebla, Av. 14 sur y Av. San Claudio, Col. San Manuel, Puebla (Mexico)
  2. Centro de Investigación y de Estudios Avanzados del Instituto Politécnico Nacional, Unidad Querétaro, Apartado Postal 1-798 Querétaro, Qro 76001 (Mexico)
  3. Departamento de Física, Instituto Nacional de Investigaciones Nucleares, Apartado postal 18-1027, México D.F. C.P. 11801 (Mexico)

Highlights: • A non-transparent cadmium oxide film has been deposited by pulsed laser deposition. • The CdO film is polycrystalline and highly oriented in the (2 0 0) direction. • Thermal treatment was applied in order to see the effect on its physical properties. - Abstract: A stable non-transparent CdO film was grown by pulsed laser deposition. The sample was thermally annealed at 500 °C in air. A (2 0 0) highly oriented polycrystalline film was obtained. The annealed sample has not preferred orientation. Scanning electron micrographs show a grain size reduction for the annealed sample. By Raman spectroscopy, the defects related second order vibrational modes of CdO were observed. Chemical composition analysis shows the presence of CdO together with a substoichiometric CdO{sub x} phase for the as-grown sample. For the annealed sample a compensation of oxygen vacancies was observed. Electrical resistivity measurements give a value of 8.602 × 10{sup −4} (Ω cm) for the as-grown film. For the annealed sample the electrical resistivity increased to a value of 9.996 × 10{sup −3} (Ω cm). Zero transmission has never been reported for CdO films. The photoluminescence spectra were measured in order to shed some light on the origin of the zero transmission.

OSTI ID:
22581514
Journal Information:
Materials Research Bulletin, Vol. 76; Other Information: Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
Country of Publication:
United States
Language:
English