Defect driven tailoring of colossal dielectricity of Reduced Graphene Oxide
- Department of Physics, Jadavpur University, Kolkata 700 032 (India)
- Department of Solid State Physics, Indian Association for the Cultivation of Science, Jadavpur, Kolkata 700 032 (India)
Highlights: • Reduced graphene oxides (RGO) are prepared by two chemical routes. • Defects in RGO are characterized by Raman, FTIR and XPS studies. • Defects tailor colossal dielectricity in RGO. - Abstract: Reduced graphene oxide (RGO) is prepared in two different chemical routes where reduction of graphene oxide is performed by hydrazine hydrate and through high pressure in hydrothermal reactor. Samples are characterized by X-ray powdered diffraction (XRD), thermo gravimetric analysis (TGA), field emission scanning electron microscopy (FESEM) and tunneling electron microscopy (TEM). Types of defects are probed by Raman, FTIR spectroscopy and X-ray photoelectron spectroscopy (XPS). UV–vis absorption reveals different optical band gaps of the two RGOs. Conductivity mechanism is studied through I–V measurements displaying different characteristic features which are addressed due to the presence of defects appeared in different synthesis. Significantly high value (∼10{sup 4}) of dielectric permittivity at 10 MHz is attractive for technological application which could be tuned by the defects present in RGO.
- OSTI ID:
- 22581449
- Journal Information:
- Materials Research Bulletin, Vol. 74; Other Information: Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
CARBON OXIDES
DIELECTRIC MATERIALS
ELECTRIC CONDUCTIVITY
FIELD EMISSION
FOURIER TRANSFORMATION
GRAPHENE
HYDRATES
HYDRAZINE
INFRARED SPECTRA
NANOSTRUCTURES
PERMITTIVITY
RAMAN SPECTROSCOPY
REDUCTION
SCANNING ELECTRON MICROSCOPY
SYNTHESIS
THERMAL GRAVIMETRIC ANALYSIS
TRANSMISSION ELECTRON MICROSCOPY
TUNNEL EFFECT
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY