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Title: Three-dimensional multimodal imaging and analysis of biphasic microstructure in a Ti–Ni–Sn thermoelectric material

The three-dimensional microstructure of levitation melted TiNi{sub 1.20}Sn has been characterized using the TriBeam system, a scanning electron microscope equipped with a femtosecond laser for rapid serial sectioning, to map the character of interfaces. By incorporating both chemical data (energy dispersive x-ray spectroscopy) and crystallographic data (electron backscatter diffraction), the grain structure and phase morphology were analyzed in a 155 μm × 178 μm × 210 μm volume and were seen to be decoupled. The predominant phases present in the material, half-Heusler TiNiSn, and full-Heusler TiNi{sub 2}Sn have a percolated structure. The distribution of coherent interfaces and high-angle interfaces has been measured quantitatively.
Authors:
;  [1] ;  [2] ; ;  [1] ;  [1] ;  [2] ;  [2]
  1. Materials Department, University of California, Santa Barbara, California 93106 (United States)
  2. (United States)
Publication Date:
OSTI Identifier:
22499242
Resource Type:
Journal Article
Resource Relation:
Journal Name: APL Materials; Journal Volume: 3; Journal Issue: 9; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CRYSTALLOGRAPHY; DIFFRACTION; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; THERMOELECTRIC MATERIALS; THREE-DIMENSIONAL LATTICES; X-RAY SPECTROSCOPY