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Title: Tetragonal BiFeO{sub 3} on yttria-stabilized zirconia

High structural susceptibility of multiferroic BiFeO{sub 3} (BFO) makes it a potential replacement of current Pb-based piezoelectrics. In this study, a tetragonal phase is identified based on a combination of x-ray diffraction, scanning transmission electronic microscopy, x-ray absorption spectroscopy, and Raman spectroscopy when BFO is grown on yttria-stabilized zirconia (YSZ) substrates. To distinguish the discrepancy between this tetragonal phase and common cases of monoclinic BFO, piezoelectric force microscopy images and optical property are also performed. It shows a lower electrostatic energy of ferroelectric domains and a large reduction of band gap for BFO grown on YSZ substrate comparing to the well-known one grown on LaAlO{sub 3} substrate. Our findings in this work can provide more insights to understand the structural diversity of multiferroic BFO system for further applications.
Authors:
 [1] ;  [2] ;  [1] ; ;  [3] ; ;  [4] ; ;  [5] ;  [6] ;  [1] ;  [2]
  1. Department of Materials Science Engineering, National Chiao Tung University, Hsinchu 30010, Taiwan (China)
  2. (China)
  3. Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656 (Japan)
  4. Department of Physics, National Cheng Kung University, Tainan 70101, Taiwan (China)
  5. Department of Physics, National Taiwan Normal University, Taipei 11677, Taiwan (China)
  6. Department of Physics, Durham University, Durham DH1 3LE (United Kingdom)
Publication Date:
OSTI Identifier:
22499219
Resource Type:
Journal Article
Resource Relation:
Journal Name: APL Materials; Journal Volume: 3; Journal Issue: 11; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ABSORPTION SPECTROSCOPY; COMPARATIVE EVALUATIONS; FERROELECTRIC MATERIALS; LANTHANUM COMPOUNDS; MONOCLINIC LATTICES; OPTICAL PROPERTIES; PIEZOELECTRICITY; RAMAN SPECTROSCOPY; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY; YTTRIUM OXIDES; ZIRCONIUM OXIDES