Tetragonal BiFeO{sub 3} on yttria-stabilized zirconia
- Department of Materials Science Engineering, National Chiao Tung University, Hsinchu 30010, Taiwan (China)
- Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656 (Japan)
- Department of Physics, National Cheng Kung University, Tainan 70101, Taiwan (China)
- Department of Physics, National Taiwan Normal University, Taipei 11677, Taiwan (China)
- Department of Physics, Durham University, Durham DH1 3LE (United Kingdom)
High structural susceptibility of multiferroic BiFeO{sub 3} (BFO) makes it a potential replacement of current Pb-based piezoelectrics. In this study, a tetragonal phase is identified based on a combination of x-ray diffraction, scanning transmission electronic microscopy, x-ray absorption spectroscopy, and Raman spectroscopy when BFO is grown on yttria-stabilized zirconia (YSZ) substrates. To distinguish the discrepancy between this tetragonal phase and common cases of monoclinic BFO, piezoelectric force microscopy images and optical property are also performed. It shows a lower electrostatic energy of ferroelectric domains and a large reduction of band gap for BFO grown on YSZ substrate comparing to the well-known one grown on LaAlO{sub 3} substrate. Our findings in this work can provide more insights to understand the structural diversity of multiferroic BFO system for further applications.
- OSTI ID:
- 22499219
- Journal Information:
- APL Materials, Vol. 3, Issue 11; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 2166-532X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ABSORPTION SPECTROSCOPY
COMPARATIVE EVALUATIONS
FERROELECTRIC MATERIALS
LANTHANUM COMPOUNDS
MONOCLINIC LATTICES
OPTICAL PROPERTIES
PIEZOELECTRICITY
RAMAN SPECTROSCOPY
SUBSTRATES
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY
YTTRIUM OXIDES
ZIRCONIUM OXIDES