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Title: Dose-dependent high-resolution electron ptychography

Recent reports of electron ptychography at atomic resolution have ushered in a new era of coherent diffractive imaging in the context of electron microscopy. We report and discuss electron ptychography under variable electron dose conditions, exploring the prospects of an approach which has considerable potential for imaging where low dose is needed.
Authors:
;  [1] ;  [2] ;  [3]
  1. School of Physics, University of Melbourne, Parkville, Victoria 3010 (Australia)
  2. JEOL Ltd., 1-2 Musashino 3-Chrome, Akishima, Tokyo 196 (Japan)
  3. Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom)
Publication Date:
OSTI Identifier:
22494975
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 119; Journal Issue: 5; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
60 APPLIED LIFE SCIENCES; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; DOSES; ELECTRON MICROSCOPY; RESOLUTION