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Title: A frequency and sensitivity tunable microresonator array for high-speed quantum processor readout

Superconducting microresonators have been successfully utilized as detection elements for a wide variety of applications. With multiplexing factors exceeding 1000 detectors per transmission line, they are the most scalable low-temperature detector technology demonstrated to date. For high-throughput applications, fewer detectors can be coupled to a single wire but utilize a larger per-detector bandwidth. For all existing designs, fluctuations in fabrication tolerances result in a non-uniform shift in resonance frequency and sensitivity, which ultimately limits the efficiency of bandwidth utilization. Here, we present the design, implementation, and initial characterization of a superconducting microresonator readout integrating two tunable inductances per detector. We demonstrate that these tuning elements provide independent control of both the detector frequency and sensitivity, allowing us to maximize the transmission line bandwidth utilization. Finally, we discuss the integration of these detectors in a multilayer fabrication stack for high-speed readout of the D-Wave quantum processor, highlighting the use of control and routing circuitry composed of single-flux-quantum loops to minimize the number of control wires at the lowest temperature stage.
Authors:
; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ;  [1] ; ; ;  [2] more »; « less
  1. D-Wave Systems, Inc., Burnaby, British Columbia V5G 4M9 (Canada)
  2. Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109 (United States)
Publication Date:
OSTI Identifier:
22494864
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 119; Journal Issue: 1; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CONTROL; D WAVES; DESIGN; DETECTION; EFFICIENCY; FABRICATION; FLUCTUATIONS; INDUCTANCE; LAYERS; POWER TRANSMISSION LINES; READOUT SYSTEMS; SENSITIVITY; TEMPERATURE RANGE 0065-0273 K; WIRES