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Title: Coupled ion redistribution and electronic breakdown in low-alkali boroaluminosilicate glass

Dielectrics with high electrostatic energy storage must have exceptionally high dielectric breakdown strength at elevated temperatures. Another important consideration in designing a high performance dielectric is understanding the thickness and temperature dependence of breakdown strengths. Here, we develop a numerical model which assumes a coupled ionic redistribution and electronic breakdown is applied to predict the breakdown strength of low-alkali glass. The ionic charge transport of three likely charge carriers (Na{sup +}, H{sup +}/H{sub 3}O{sup +}, Ba{sup 2+}) was used to calculate the ionic depletion width in low-alkali boroaluminosilicate which can further be used for the breakdown modeling. This model predicts the breakdown strengths in the 10{sup 8}–10{sup 9 }V/m range and also accounts for the experimentally observed two distinct thickness dependent regions for breakdown. Moreover, the model successfully predicts the temperature dependent breakdown strength for low-alkali glass from room temperature up to 150 °C. This model showed that breakdown strengths were governed by minority charge carriers in the form of ionic transport (mostly sodium) in these glasses.
Authors:
 [1] ; ; ;  [2]
  1. Agency for Defense Development, Daejeon 305-600 (Korea, Republic of)
  2. Center for Dielectrics and Piezoelectrics, Materials Research Institute, The Pennsylvania State University, N-329 Millennium Science Complex, University Park, Pennsylvania 16802 (United States)
Publication Date:
OSTI Identifier:
22494791
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 118; Journal Issue: 8; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; BARIUM IONS; CHARGE CARRIERS; CHARGE TRANSPORT; COMPUTERIZED SIMULATION; DIELECTRIC MATERIALS; ENERGY STORAGE; GLASS; HYDROGEN IONS 1 PLUS; OXONIUM IONS; SODIUM IONS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; THICKNESS