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Title: Temporal resolution limit estimation of x-ray streak cameras using a CsI photocathode

A Monte Carlo model is developed and implemented to calculate the characteristics of x-ray induced secondary electron (SE) emission from a CsI photocathode used in an x-ray streak camera. Time distributions of emitted SEs are investigated with an incident x-ray energy range from 1 to 30 keV and a CsI thickness range from 100 to 1000 nm. Simulation results indicate that SE time distribution curves have little dependence on the incident x-ray energy and CsI thickness. The calculated time dispersion within the CsI photocathode is about 70 fs, which should be the temporal resolution limit of x-ray streak cameras that use CsI as the photocathode material.
Authors:
; ; ; ;  [1]
  1. Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Institute of Optoelectronics, Shenzhen University, Shenzhen 518060 (China)
Publication Date:
OSTI Identifier:
22494785
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 118; Journal Issue: 8; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CESIUM IODIDES; COMPUTERIZED SIMULATION; ELECTRONS; KEV RANGE; MONTE CARLO METHOD; PHOTOCATHODES; SECONDARY EMISSION; STREAK CAMERAS; TIME DEPENDENCE; TIME RESOLUTION; X RADIATION