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Title: Self-consistent modelling of electrochemical strain microscopy in mixed ionic-electronic conductors: Nonlinear and dynamic regimes

The frequency dependent Electrochemical Strain Microscopy (ESM) response of mixed ionic-electronic conductors is analyzed within the framework of Fermi-Dirac statistics and the Vegard law, accounting for steric effects from mobile donors. The emergence of dynamic charge waves and nonlinear deformation of the surface in response to bias applied to the tip-surface junction is numerically explored. The 2D maps of the strain and concentration distributions across the mixed ionic-electronic conductor and bias-induced surface displacements are calculated. The obtained numerical results can be applied to quantify the ESM response of Li-based solid electrolytes, materials with resistive switching, and electroactive ferroelectric polymers, which are of potential interest for flexible and high-density non-volatile memory devices.
Authors:
;  [1] ;  [2] ;  [3] ;  [4] ;  [5]
  1. Institute of Physics, National Academy of Sciences of Ukraine, 46, pr. Nauky, 03028 Kyiv (Ukraine)
  2. National Research University of Electronic Technology “MIET,” 124498 Moscow (Russian Federation)
  3. National University of Science and Technology “MISiS,” 119049 Moscow, Leninskiy pr. 4 (Russian Federation)
  4. Institute for Problems of Materials Science, NAS of Ukraine, Krjijanovskogo 3, 03142 Kyiv (Ukraine)
  5. The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)
Publication Date:
OSTI Identifier:
22494752
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 118; Journal Issue: 7; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; COMPUTERIZED SIMULATION; CONCENTRATION RATIO; DEFORMATION; ELECTROCHEMISTRY; FERMI STATISTICS; FERROELECTRIC MATERIALS; FREQUENCY DEPENDENCE; LITHIUM; MEMORY DEVICES; MICROSCOPY; NONLINEAR PROBLEMS; POLYMERS; SEMICONDUCTOR JUNCTIONS; SOLID ELECTROLYTES; STRAINS; SURFACES; VEGARD LAW