Photoluminescence study of p-type vs. n-type Ag-doped ZnO films

Journal Article · Fri Aug 14 00:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4928183· OSTI ID:22494739

Myers, M. A.; Jian, J. ^[1]; Khranovskyy, V. ^[2]; Lee, J. H.; Wang, Han ^[3]; Wang, Haiyan ^[1]

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1. Department of Electrical and Computer Engineering, Texas A&M University, College Station, Texas 77843-3128 (United States)
2. Department of Physics, Chemistry and Biology, Linkoping University, 583 81 Linkoping (Sweden)
3. Department of Materials Science and Engineering, Texas A&M University, College Station, Texas 77843-3003 (United States)

Silver doped ZnO films have been grown on sapphire (0001) substrates by pulsed laser deposition. Hall measurements indicate that p-type conductivity is realized for the films deposited at 500 °C and 750 °C. Transmission electron microscopy images show more obvious and higher density of stacking faults (SFs) present in the p-type ZnO films as compared to the n-type films. Top view and cross sectional photoluminescence of the n- and p-type samples revealed free excitonic emission from both films. A peak at 3.314 eV, attributed to SF emission, has been observed only for the n-type sample, while a weak neutral acceptor peak observed at 3.359 eV in the p-type film. The SF emission in the n-type sample suggests localization of acceptor impurities nearby the SFs, while lack of SF emission for the p-type sample indicates the activation of the Ag acceptors in ZnO.

• OSTI ID: 22494739
• Journal Information: Journal of Applied Physics, Vol. 118, Issue 6; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DOPED MATERIALS
ENERGY BEAM DEPOSITION
EV RANGE
HALL EFFECT
IMAGES
IMPURITIES
LASER RADIATION
N-TYPE CONDUCTORS
PHOTOLUMINESCENCE
P-TYPE CONDUCTORS
PULSED IRRADIATION
SAPPHIRE
SILVER
STACKING FAULTS
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
ZINC OXIDES