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Title: Periodicity in bimodal atomic force microscopy

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4927733· OSTI ID:22494662
; ;  [1];  [2]
  1. Laboratory for Energy and NanoScience (LENS), Institute Center for Future Energy (iFES), Masdar Institute of Science and Technology, Abu Dhabi (United Arab Emirates)
  2. Departament de Disseny i Programació de Sistemes Electrònics, UPC - Universitat Politècnica de Catalunya, Av. Bases, 61, 08242 Manresa (Barcelona) (Spain)

Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship between the excited frequencies is shown to affect and control both experimental observables and the main expressions quantified via these observables, i.e., virial and energy transfer expressions, which form the basis of the bimodal AFM theory. The presence of a fundamental frequency further simplifies the theory and leads to close form solutions. Predictions are verified via numerical integration of the equation of motion and experimentally on a mica surface.

OSTI ID:
22494662
Journal Information:
Journal of Applied Physics, Vol. 118, Issue 4; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English