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Title: Distribution of distances between dislocations in different types of dislocation substructures in deformed Cu-Al alloys

The aim of the investigation was the determination of the statistic description of dislocation distribution in each dislocation substructures component forming after different deformation degrees in the Cu-Al alloys. The dislocation structures were investigated by the transmission diffraction electron microscopy method. In the work the statistic description of distance distribution between the dislocations, dislocation barriers and dislocation tangles in the deformed Cu-Al alloys with different concentration of Al and test temperature at the grain size of 100 µm was carried out. It was established that the above parameters influence the dislocation distribution in different types of the dislocation substructures (DSS): dislocation chaos, dislocation networks without disorientation, nondisoriented and disoriented cells, in the walls and inside the cells. The distributions of the distances between dislocations in the investigated alloys for each DSS type formed at certain deformation degrees and various test temperatures were plotted.
Authors:
; ; ;  [1] ;  [1] ;  [2]
  1. Tomsk State University of Architecture and Building, 2 Solyanaya St., Tomsk, 634003 (Russian Federation)
  2. (Russian Federation)
Publication Date:
OSTI Identifier:
22494442
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1698; Journal Issue: 1; Conference: AMTC-2015: 2. all-Russian scientific conference of young scientists on advanced materials in technology and construction, Tomsk (Russian Federation), 6-9 Oct 2015; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 36 MATERIALS SCIENCE; ALUMINIUM ALLOYS; CHAOS THEORY; CONCENTRATION RATIO; COPPER ALLOYS; DEFORMATION; DISLOCATIONS; DISTANCE; DISTRIBUTION; ELECTRON DIFFRACTION; GRAIN SIZE; TRANSMISSION ELECTRON MICROSCOPY